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DAOS-17045 bio: drain inflight health collecting on teardown #15884

Merged
merged 1 commit into from
Feb 17, 2025
Merged

DAOS-17045 bio: drain inflight health collecting on teardown #15884

merged 1 commit into from
Feb 17, 2025

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NiuYawei
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When teardown a faulty device, ensure the inflight health collecting NVMe command completed before putting the io channel & open descriptor for health monitor.

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@NiuYawei
DAOS-17045 bio: drain inflight health collecting on teardown
6437a93 
When teardown a faulty device, ensure the inflight health collecting
NVMe command completed before putting the io channel & open descriptor
for health monitor.

Signed-off-by: Niu Yawei <[email protected]>
@NiuYawei NiuYawei requested review from a team as code owners February 11, 2025 04:05
@NiuYawei NiuYawei requested a review from tanabarr February 11, 2025 04:05
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Ticket title is 'server segfault on aurora with spdk'
Status is 'In Progress'
Labels: 'ALCF,alcf_track'
https://daosio.atlassian.net/browse/DAOS-17045

@NiuYawei NiuYawei requested a review from wangshilong February 11, 2025 04:06
wangshilong
wangshilong approved these changes Feb 11, 2025
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Do we need port this to 2.6 as well?

tanabarr
tanabarr approved these changes Feb 11, 2025
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no unit tests for this area of code, is it considered safely covered by functional tests?

@NiuYawei
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Do we need port this to 2.6 as well?

Yes, I'll backport it for 2.6.4 once it's landed to master.

@NiuYawei
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no unit tests for this area of code, is it considered safely covered by functional tests?

yes, this defect can't be detected by unit test, since it's a race happened on server mode. I think we might already have some functional test which marks device as faulty? but that's not necessarily discover this race issue.

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Test stage Functional Hardware Large completed with status FAILURE. https://build.hpdd.intel.com//job/daos-stack/job/daos/view/change-requests/job/PR-15884/2/execution/node/1420/log

@NiuYawei NiuYawei requested a review from a team February 17, 2025 01:19
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The test failure is DAOS-16737, which is not related to the PR. I think we'd force land this.

@NiuYawei NiuYawei added the forced-landing The PR has known failures or has intentionally reduced testing, but should still be landed. label Feb 17, 2025
@mchaarawi mchaarawi merged commit fce3b1f into master Feb 17, 2025
55 of 57 checks passed
@mchaarawi mchaarawi deleted the niu/DAOS-17045 branch February 17, 2025 15:50
NiuYawei added a commit that referenced this pull request Feb 18, 2025
@NiuYawei
DAOS-17045 bio: drain inflight health collecting on teardown (#15884)
56bf217 
When teardown a faulty device, ensure the inflight health collecting
NVMe command completed before putting the io channel & open descriptor
for health monitor.

Signed-off-by: Niu Yawei <[email protected]>
gnailzenh pushed a commit that referenced this pull request Feb 19, 2025
@NiuYawei
DAOS-17045 bio: drain inflight health collecting on teardown (#15884) (…
c5a567c 
…#15922)

When teardown a faulty device, ensure the inflight health collecting
NVMe command completed before putting the io channel & open descriptor
for health monitor.

Signed-off-by: Niu Yawei <[email protected]>
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@tanabarr tanabarr tanabarr approved these changes

@wangshilong wangshilong wangshilong approved these changes

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@NiuYawei @daosbuild1 @tanabarr @wangshilong @mchaarawi